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SEMI E195-0925 - Test Method Using Adhesive Replacement ..

S5 Series

Particle Sampling Films/Strips

SEMI E195-0925 - Test Method Using Adhesive Replacement ..

SEMI E195-0925 - Test Method Using Adhesive Replacement Substrates to Assess Particulate Surface Contamination on Critical Chamber Components


Jedex Inc. registered a patent for an adhesive extraction method extraction material and a particle counter using it about 10 years before the SEMI E195 standard was established, started sales, and continues to supply high-efficiency devices and materials.

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S5 Series

FAB Equipment's Parts Cleanliness , Wafer Foups, Carriers, Shoe Boxes , Tray, Bags , Semiconductor Packaging , Testing , SEMI E195-0925 - Test Method Using Adhesive Replacement .. , Particle Testing (Cleanroom, Supplies) , Cleaning(Equipment,Tray, Carrier, Magazine) , Particle Testing (Equipment,Tray, Carrier, Magazine ) , Liquids, Cleaning Bath , Equipments Cleanliness , Materials(Glass,CG. OCA, Films, Trays) , Equipment's Parts Cleanliness , OLEDoS Processing , Process particle monitoring , Cleaning(Equipment,Tray, Carrier ..)

Particle Sampling Films/Strips

SEMI E195 Adhesive Replacement Substrates

FAB Equipment's Parts Cleanliness , Wafer Foups, Carriers, Shoe Boxes , Tray, Bags , Equipment's Parts Cleanliness , SEMI E195-0925 - Test Method Using Adhesive Replacement ..

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