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Greetings from the JEDEX Contamination Control Solution Team.


We are attaching a press release regarding the SEMI E195 Chamber Particle Inspection Solution.


We appreciate your interest.


Thank you.


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PRESS RELEASE JDX-PR-E195-2026 MM DD, 2026
JEDEX Inc. Contamination Control Lab press@jedex.com +82-70-8233-7766
FOR IMMEDIATE RELEASE
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JEDEX Expands Its SEMI E195 Compliant Solution Lineup
─ Official Launch of the "S505 + DD Films" Surface Particle Assessment Package ─
 
[YONGIN, KOREA — MM DD, 2026] JEDEX Inc. (www.jedex.com), a contamination
control specialist for the semiconductor industry, today announced the expansion
of its SEMI E195 compliant surface particle assessment solution lineup with the
official launch of the "S505 + DD Films" integrated package — a unified offering
targeting all four semiconductor value-chain segments: equipment makers (OEM/IDM),
parts cleaning vendors, component manufacturers, and PM service providers.
 
The package implements the Adhesive Replacement Substrate (ARS) method specified
in SEMI E195 (Test Method Using Adhesive Replacement Substrates to Assess
Particulate Surface Contamination on Critical Chamber Components) on a single
platform. The non-destructive method transfers particles from Critical Chamber
Component (CCC) surfaces onto an adhesive film and counts them optically,
achieving dual compliance with SEMI E195 and ISO 14644-9.
 
▶ S505 Key Specifications
· Please contact us for more detail.
 
▶ DD-series Films (Patents: KR · CN · EU · JP · US · VN)
· Standard: DD FAB-200HR (FAB-grade high-adhesive · high-clean)
· Tight features: DD-500HR (slots, grooves, edges)
· Software: MicroLabo Ver. 9.0.1 — immediate Excel output
 
▶ Use Cases by Segment
· Equipment Makers : Standardize CCC incoming inspection; specify cleanliness
specs in OEM–Tier 1 contracts
· Cleaning Vendors : Quantitative before/after comparison; include SEMI E195
compliant report in shipment package
· Component Makers : 1–2 sec line-side QC; strengthen CoA with ISO 14644-9
· PM Providers : On-site / PM-truck operation; instant post-PM diagnosis
with a single adhesive film
 
JEDEX plans to build on this lineup into a comprehensive cleanliness management
portfolio covering airborne particle monitoring, critical component inspection,
and cleaning solutions.
 
■ About JEDEX JEDEX Inc. is a contamination control specialist providing
surface and airborne particle detection solutions for semiconductor equipment
parts, including S505, DD Films, ParticlePRO, M series, and MONACO.
HQ: #1612 Heungdeok IT Valley, Giheung-Gu, YongIn-Si, GyeongGi-Do, Korea.
 
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Contact: Contamination Control Lab press@jedex.com / +82-70-8233-7766
Available: Hi-res product photos · measurement data samples · demo coverage
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