S5 Series
S5 Series
S5 Series

Applications

  • Semiconductror
  • SEMI E195-0925 - Test Method Using Adhesive Replacement ...
    1. SEMI E195-0925 - Test Method Using Adhesive Replacement Substrates to Assess Particulate Surface Contamination on Critical Chamber Components
  • Surface Particle Counter S505 Series
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The S5 series is a device designed for particle counting, utilizing our independently developed particle collection films (such as the DD series) that offer superior collection performance and precise control.

This device incorporates patented, innovative detection technologies developed by JEDEX Co., Ltd., resulting in exceptional particle detection performance and high-speed detection capabilities.

The S5 series can be applied to a wide range of tasks, including in-process particle detection and management, incoming inspection, outgoing inspection, and new product development.

Related  STANDARDs 

SEMI E195-0925 - Test Method Using Adhesive Replacement Substrates to Assess Particulate Surface Contamination on Critical Chamber Components


ASTM E1216-21 – Standard Practice for Sampling for Particulate Contamination by Tape Lift


ISO 14644-17:2021 - Particle deposition rate applications

ISO 14644-9:2022 - Assessment of surface cleanliness for particle concentration


IEST STD-CC1246E - Product Cleanliness Levels - Applications, Requirements, and Determination

IEST-RP-CC005: Gloves and Finger Cots Used in Cleanrooms and Other Controlled Environments


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