Particle Sampling Films/Strips
SEMI E195 Adhesive Replacement Substrates
JEDEX — Particle Sampling Materials
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Particle Sampling Materials

Professional sampling films and materials for collecting surface and falling particles, designed for analysis with JEDEX S-Series particle counters, Microscope, SEM/EDS, LIBs, FTIR and other instruments.

13+
Products
5μm
Particle Ctrl
6
Intl. Patents

JEDEX Transparent Film + Particle Counter — Why Different?

Superior Detection Efficiency

The combination of JEDEX transparent film and JEDEX surface particle counters delivers significantly higher detection efficiency compared to black film or white membrane methods, making it exceptional at uncovering particle risks.

Patented Structural Innovation

The patented multi-layer structure makes particle collection extremely convenient and eliminates the need for a separate carrier, dramatically reducing costs. Load directly into the counter after collection for immediate analysis.

Transparent Film + Counter
Maximized detection
3-Layer Patented Structure
No carrier · Cost savings
Collect → Load → Count
Faster workflow

Patents: KR 10-1582461 / US 9,964,480 / JP 6337388 / EU 3211397 / CN ZL2015800572836 / VN 29661

Custom Manufacturing Available

Specifications, sizes, adhesion, grid patterns — tailored to your requirements.
Custom Order Inquiry
Surface Particle Sampling Films
Films for collecting 5–5000μm particles from flat surfaces for analysis with JEDEX particle counters, Microscope, SEM/EDS, LIBs, FTIR and other instruments.
DD-200HR100 sheets/pack
The most versatile surface particle sampling film. Used for general sample collection and analysis with Microscope (low/high magnification), SEM/EDS (Hitachi, JEOL, etc.), LIBs, FTIR and other analytical instruments.
Applications
  • Particle collection for JEDEX S-Series counters
  • Microscope observation (low/high mag)
  • SEM/EDS analysis (Hitachi, JEOL, etc.)
  • General surface particle sampling
Specifications
SeparationStandard
Particle5μm
Area20×50mm
Size90×30mm, 3 Layers
GridGreen 1000μm (Peel Off)
Compatible Counters
S6S5S3SProSA3SA5
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DD-500HR100 sheets/pack
A small-area model for collecting surface particles in narrow spaces. Captures particles in gaps of precision components and on small surface areas.
Applications
  • Particle collection for JEDEX S-Series counters
  • Narrow-area surface particle sampling
  • Microscope/SEM/EDS small-surface analysis
Specifications
SeparationStandard
Particle5μm
Area10×10, 10×20mm
Size90×30mm, 3 Layers
GridGreen 1000μm
Compatible Counters
S6S5S3SProSA3SA5
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DD-200H100 sheets/pack
Higher separation force than the HR series. For collecting strongly-adhered particles from surfaces with high adhesion.
Applications
  • Particle collection for JEDEX S-Series counters
  • Strongly-adhered particle sampling (high force)
  • Microscope/SEM/EDS analysis
Specifications
SeparationHigh
Particle5μm
Area20×50mm
Size90×30mm, 3 Layers
GridGreen 1000μm (Base)
Compatible Counters
S6S5S3SProSA3SA5
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DD-500H100 sheets/pack
High separation force, small-area model for capturing strongly-adhered particles in narrow spaces.
Applications
  • Particle collection for JEDEX S-Series counters
  • Narrow-area strongly-adhered sampling
  • High separation force, small area
Specifications
SeparationHigh
Particle5μm
Area20×30mm
Size90×30mm, 3 Layers
GridGreen 1000μm (Base)
Compatible Counters
S6S5S3SProSA3SA5
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DD-100100 sheets/pack
Optimized for Microscope grid cell analysis. The 500μm high-density grid enables precise location mapping and repeatable observation.
Applications
  • Particle collection for JEDEX S-Series counters
  • Microscope grid cell analysis
  • 500μm grid precise location mapping
  • SEM/EDS sample collection
Specifications
SeparationStandard
Particle5μm
Area20×50mm
Size90×30mm, 3 Layers
GridGreen 500μm high-density (Base)
Compatible Counters
S5S3SProSA3SA5
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DD-400100 sheets/pack
Ultra-high separation force enables simultaneous particle removal and sampling. Performs cleaning and analysis in a single step.
Applications
  • Particle collection for JEDEX S-Series counters
  • Particle removal + sampling (ultra-high)
  • Equipment cleaning + particle analysis
  • Microscope/SEM/EDS compatible
Specifications
SeparationUltra-High
Particle5μm
Area20×50mm
Size90×30mm, 3 Layers
GridRed 1000μm (Base)
Compatible Counters
S6S5S3SProSA3SA5
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DD BLACK100 sheets/pack
Black film maximizing the visibility of light-colored particles. Black and near-black particles are excluded from counting.
Applications
  • Particle collection for JEDEX S-Series counters
  • Excludes black/near-black counting
  • Light-colored particle observation
  • Microscope/SEM/EDS analysis
Specifications
SeparationStandard
Particle5μm
Area20×50mm
Size90×30mm, 3 Layers
Compatible Counters
S6S5S3SProSA3SA5
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Falling Particle Sampling
Glass and silicon wafers for collecting falling particles in sealed environments such as chambers, ovens, plasma and liquid-cleaning baths.
Glass WaferContact for pricing
Particle collection in chambers, high-temperature, plasma and liquid-cleaning baths. Excellent heat and chemical resistance. Pre-shipment particle count guaranteed.
Applications
  • Particle collection for JEDEX S-Series counters
  • Chamber/high-temp/plasma particle collection
  • Semiconductor/display process monitoring
Specifications
Size2–8 inch (100–200mm)
GuaranteePre-shipment guaranteed
Compatible Counters
S6S3SA5SA3S300SPro
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Silicon WaferContact for pricing
Same material as actual process wafers. Simulates real process conditions in sealed environments. Pre-shipment particle count guaranteed.
Applications
  • Particle collection for JEDEX S-Series counters
  • Chamber/high-temp/plasma particle collection
  • Real process environment simulation
Specifications
Size2–8 inch (100–300mm)
GuaranteePre-shipment guaranteed
Compatible Counters
S6SA5SA3S300
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Wide-Area Particle Sampling
Wide-format films dedicated to broad-area surface, falling and airborne particle collection.
DD-2215H50 sheets/pack
Wide-format film with a 100×150mm sampling area. Optimized for cleanroom and clean-bench monitoring. Ultra-high adhesion captures even fine particles reliably.
Applications
  • Particle collection for JEDEX S-Series counters
  • Wide-area falling particle (large format)
  • Airborne particle sampling
  • Cleanroom/clean bench monitoring
Specifications
SeparationUltra-High
Area100×150mm
Size212×104mm, 3 Layers
GridGreen 1000μm (Base)
Compatible Counters
S6 (Outer Head)SMD150SA3005S350LA
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Attachment-Type Sampling
Attach to mobile robots, magazines and parts to detect particles adhering along travel paths.
DD-AIR 707550 sheets/pack
Attaches to mobile robots, magazines and parts to detect particles adhering along travel paths. 4-Layer structure including an Attaching Cover.
Applications
  • Particle collection for JEDEX S-Series counters
  • Attach to mobile robots/magazines/parts
  • Travel path particle detection
Specifications
SeparationStandard
Particle5μm
Area50×50mm
Layers4 (incl. Attaching Cover)
Compatible Counters
SProSA3
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Surface Particle Collection & Counting Procedure

5–5000μm particles on flat surfaces | Patented structure

1

Prepare Film
Select the appropriate sampling film for the surface size to be inspected.
2

Collect Particles
Place the adhesive side on the target surface and press with a sampling stick to transfer particles.
3

Pack & Transport
Re-attach the protective cover, place in the packing box and transport to the counter location.
4

Load Counter
Load the film into the loading fixture of the S-Series counter.
5

Detect & Count
Particle detection and counting proceed automatically.

B2B Volume Orders · Custom Manufacturing

Custom pricing for volume orders. Custom manufacturing available.
Request Quote

Patents: KR 10-1582461 / US 9,964,480 / JP 6337388 / EU 3211397 / CN ZL2015800572836 / VN 29661

Contact: info@jedex.com | Ph. +82-70-8233-7766

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