Wafer Foups, Carriers, Shoe Boxes
M7000/M1000R25 (new)
Parts cleanliness and particle testing system for Shower Heads, Electrodes, ESC, Chucks, Robot Arms, Focus rings, Cleanroom Wipers, FOUPs ..,
Particles on Cleanroom Garments & Supplies
T802
Particle Testing System for Semiconductor and Display Industry
Semiconductor Packaging , Testing
SA (Auto Scan, Smart Counting)
A device that detects and counts foreign substances and particles present on the surfaces of silicon, GaAs, GaN wafers and inner layers of glass, transparent or translucent films (OCA films, polarizing films, etc.), Metal surfaces.
Process particle monitoring
S300 Series
Detects and counts particles in the assembled state of glass for OLEDoS display production, liquid crystal deposited on the display plate, and glass substrate. This is a complete product inspection device required for mass production.
Semiconductor Packaging , Testing
SPro (Auto focus, fast scan)
The SPro3 series is a device that detects and counts foreign substances and particles present on the surface and inner layers of Glass, transparent or translucent films (OCA films, polarized films, etc.) l
SEMI E195-0925 - Test Method Using Adhesive Replacement ..
S5 Series
Count particles on Jedex films , Entry Level surface particle counter
