Wafer Foups, Carriers, Shoe Boxes

M7000/M1000R25 (new)

Parts cleanliness and particle testing system for Shower Heads, Electrodes, ESC, Chucks, Robot Arms, Focus rings, Cleanroom Wipers, FOUPs ..,

Particles on Cleanroom Garments & Supplies

T802

Particle Testing System for Semiconductor and Display Industry

Semiconductor Packaging , Testing

SA (Auto Scan, Smart Counting)

A device that detects and counts foreign substances and particles present on the surfaces of silicon, GaAs, GaN wafers and inner layers of glass, transparent or translucent films (OCA films, polarizing films, etc.), Metal surfaces.

Process particle monitoring

S300 Series

Detects and counts particles in the assembled state of glass for OLEDoS display production, liquid crystal deposited on the display plate, and glass substrate. This is a complete product inspection device required for mass production.

Semiconductor Packaging , Testing

SPro (Auto focus, fast scan)

The SPro3 series is a device that detects and counts foreign substances and particles present on the surface and inner layers of Glass, transparent or translucent films (OCA films, polarized films, etc.) l

SEMI E195-0925 - Test Method Using Adhesive Replacement ..

S5 Series

Count particles on Jedex films , Entry Level surface particle counter